4 results
Energy resolution at the Fano limit: The benefits of the principle of sideward depletion for solid state X-ray spectrometry
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- Journal:
- Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
- Published online by Cambridge University Press:
- 01 August 2018, pp. 728-729
- Print publication:
- August 2018
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Advanced 4D STEM Imaging with the pnCCD (S)TEM Camera
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- Journal:
- Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
- Published online by Cambridge University Press:
- 04 August 2017, pp. 58-59
- Print publication:
- July 2017
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Five Dimensional X-ray Imaging with the Color X-ray Camera
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- Journal:
- Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
- Published online by Cambridge University Press:
- 04 August 2017, pp. 1010-1011
- Print publication:
- July 2017
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Setup and Practical Applications of a pnCCD Based XRF System
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- Journal:
- Microscopy and Microanalysis / Volume 21 / Issue S3 / August 2015
- Published online by Cambridge University Press:
- 23 September 2015, pp. 167-168
- Print publication:
- August 2015
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